RESEARCH ON THE THERMAL CONDUCTIVITY PROPERTIES OF SILICON OXIDE
Abstract
Silicon oxide (SiO₂) is a widely used material in various industries, including electronics, optics, and thermal insulation, due to its unique thermal and electrical properties. This study investigates the thermal conductivity of silicon oxide under different conditions, including temperature variations and structural forms (amorphous vs. crystalline). Experimental measurements conducted using the laser flash analysis (LFA) method, complemented by molecular dynamics simulations. The results reveal that the thermal conductivity of SiO₂ is highly dependent on its structural form and temperature, with crystalline SiO₂ exhibiting higher conductivity its amorphous counterpart. These findings have significant implications for the design and optimization of SiO₂-based materials in thermal management applications.
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